Advanced Materials Technologies
X‐Ray Detectors: Sensitive and Fast Direct Conversion X‐Ray Detectors Based on Single‐Crystalline HgI2 Photoconductor and ZnO Nanowire Vacuum Diode
Zhipeng Zhang, Zhaojun Zhang, Wei Zheng, Kai Wang, Huanjun Chen, Shaozhi Deng, Feng Huang, Jun Chen
In article number 1901108, Feng Huang, Jun Chen, and co‐workers design a direct conversion X‐ray detector based on a HgI2 crystal and a ZnO nanowire vacuum diode to overcome the current runaway effect at high operating electric field and improve the detection sensitivity. The detector shows a sensitivity of 6.8 × 103 μCGyair−1 cm−2 and a response time of 0.24 ms. The proposed X‐ray detector is promising for the application of low dose X‐ray detection.